EDN

Modeling process variability in design flow

It is becoming more and more difficult in nanometer designs to reliably print the image intended by the designer. This task is demanding enough under normal conditions; maintaining pattern fidelity ...
EDN

Tool characterizes process variability

Start-up Stratosphere Solutions has announced that it is delivering its StratoPro platform, which targets design for manufacturability (DFM) and design for yield (DFY) by characterizing process ...
Semiconductor Engineering

Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle

A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...